Definition: Kelvin Probe Force Microscopy (KPFM), also known as Surface Potential Microscopy, is a cutting-edge scanning probe microscopy technique that measures the surface potential of materials at ...

Kelvin probes are a special type of probe for making accurate resistance measurements using four wires and, in fact, the probe’s jaws are electrically isolated from each other. We liked [Tom’s ...

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What is Electrostatic Force Microscopy? Electrostatic Force Microscopy (EFM) is a scanning probe microscopy technique that measures the electrostatic interactions between a conductive probe and a ...