NAND Flash is named after the NAND (NOT-AND) logic gate, which is used in its basic architecture. The term "NAND" is derived from the way the memory cells are organized in a series-connected structure ...

This echoes the need to move to high-Κ metal gates in DRAM – bringing the need for careful device engineering in order to meet the requirements of both the memory cells and the logic. And finally, as ...

The flash memory used for solid state drives (SSDs) and USB drives also stores bits in cells; however, when the power is turned off, the memory cells retain their content (see flash memory).

[1] Memories do not include logic gates and flip-flops. As a result, different fault models and test algorithms are required to test memories. MBIST is a self-testing and repair mechanism which tests ...