Scanning microwave microscopy (SMM) is a powerful imaging technique that combines the principles of atomic force microscopy (AFM) and microwave technology to study the electrical properties of ...

This new microscope combines the sensitive microwave detection of Josephson junctions with the high spatial resolution of scanning probe microscopy. The Josephson probe microscope offers an ultra ...

the development of high-speed scanning probes for dynamic studies, and the use of advanced algorithms for data analysis, enhancing both the resolution and the range of applications. Recent ...

Operating at 2.7 GHz, it probes electrochemical activity using a specialized scanning probe setup. A bias tee linked to a vector network analyzer (VNA) transmits and receives microwave signals ...

A scanning probe microscope comes in a wide variety of flavors, they all produce a set of data points containing the measurements at each location. Usually these data points form a regular 2D grid ...

Atomic force microscopy is a subset of scanning probe microscopy. The Veeco Nanoscope II operates in contact mode and is primarily used for high-resolution imaging and surface force measurements in ...

Three powerful options are available with Bruker for performing electrochemical (EC) scanning probe microscopy: Electrochemical Scanning Tunneling Microscopy (ECSTM), Electrochemical Atomic Force ...

Atomic force microscopy is a subset of scanning probe microscopy. The Veeco Dimension 3000 operates in both tapping and contact modes, with capabilities of topographic and phase imaging, lateral force ...