Harness the potential of factory automation with cutting-edge X-Ray diffraction technology. The Wafer XRD 300 stands as an ultra-fast, high-precision metrology module designed for crystal orientation ...

Let us help you with your inquiries, brochures and pricing requirements Request A Quote Download PDF Copy Request A Quote Download PDF Copy Request A Quote Download ...

Precise characterization of the wafer offcut or miscut ... to protect the underlying 4H-SiC crystal and allow the defects to have a predictable orientation throughout epitaxial growth.