High parallelism is a key factor in reducing costs during wafer-level testing. Wafer testing is conducted using Automatic Test Equipment (ATE) along with test infrastructures such as the Prober ...

If the product requires wafer level testing, then more hardware is needed. In addition to a manual test rig, I will also have been designing a probe card, which will connect to the ATE head with a ...

presents the achievement in 3D/2.5D MEMS probe card development for WAT test (Wafer Acceptance Test, WAT) and provides users the positive effects on test efficiency and reliable results.

FormFactor (FORM) is a $2.5 billion OEM of automated wafer probe cards and other testing devices used in the back-end portion of the semiconductor manufacturing process. FORM serves the requirements ...

presents the achievement in 3D/2.5D MEMS probe card development for WAT test (Wafer Acceptance Test, WAT) and provides users the positive effects on test efficiency and reliable results. STAr Virgo ...

Keysight has enhanced its double-pulse test portfolio enabling customers to benefit from accurate and easy measurement of the ...